TRI launches New High Throughput In-Circuit Tester with Vacuum Fixture

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Test Research Inc., has announced the launch of the high-density pin count In-Circuit Tester (ICT) TR8100H SII with vacuum fixture for full coverage testing. The TR8100H SII is the latest high-performance board test system targeting the low-voltage testing market, as well as for large and complex PCBAs.

TR8100H SII's vacuum fixture system ensures full pin contact, and with up to 11,088 pins digital MUX-free architecture, the system allows for faster and simpler testing of large pin-count devices and fast program development. The ICT has built-in self-diagnostics to ensure long-term testing reliability.

Features of the TRI81001H include:

• High fault coverage test solution with vacuum fixture
• Low voltage device testing and rapid test speed
• Built-in Self Diagnostics function
• High-Accuracy Measurement and Testing
• Friendly UI, easy program development

Click here to learn more about TRI's TRI8100H.